Self-assembled nanocrystals of ZnO were embedded within a SiO2 matrix by a sequential deposit using reactive R.F. sputtering. The ZnO nanoparticles (NP’s) were obtained by depositing a very thin layer (~20 nm) of Zn on the bottom of the valleys of a first SiO2 rough surface and then covered by another SiO2 layer at 500 ºC. The stress produced, due to the cooling process, by the SiO2 matrix on the ZnO NP’s generates an unusual crystalline phase of ZnO. The crystal structure was determined by means of X ray diffraction patterns. The ZnO + SiO2 composite shows a transmittance higher than 80 % for wavelengths > 450 nm. Optical absorption allows to reveal the character and value of the optical band gap. Vibrational modes of the material were determined by Raman spectroscopy.

Indium-doped zinc oxide (IZO) polycrystalline thin films were grown on polyethylene terephthalate (PET), polyethylene naphthalate (PEN), and as reference on 7059 Corning glass substrates at room temperature by radio frequency magnetron sputtering from a target prepared with a mixture of ZnO and In2O3 powders. The structural, optical, and electrical properties of the films were analyzed and compared. The IZO polycrystalline films showed n-type conductivity. The electrical resistivity drops significantly, and the carrier concentration increases as a consequence of In incorporation within the ZnO crystalline lattice. In both cases the changes are of several orders of magnitude. The resistivity obtained was 3.1 ± 0.5 x 10-3 Ω-cm for an IZO sample grown on PET with a carrier concentration of 3.1 ± 0.7 x 1020 cm-3, the best mobility obtained was 27.7 ± 0.8 cm2V-1s-1 for an IZO sample grown on PEN. From the results, we conclude that n-type IZO polycrystalline films with high transmittance, high mobility and low resistivity were obtained on flexible transparent substrates.

In this work we report the formation of long microcrystalline linear self-assemblies observed during the thin film growth of several II-VI compounds. Polycrystalline CdTe, CdS, CdCO3, and nanocrystalline CdTe:Al thin films were prepared on glass substrates by different deposition techniques. In order to observe these crystalline formations in the polycrystalline materials, the thin film growth was suspended before the grains reached to form a continuous layer. The chains of semiconductor crystals were observed among many isolated and randomly distributed grains. Since CdTe, CdTe:Al, CdS and CdCO3 are not ferroelectric and/or ferromagnetic materials, the relevant problem would be to explain what is the mechanism through which the grains are held together to form linear chains. It is well known that some nanocrystalline materials form rods and wires by means of electrostatic forces. This occurs in polar semiconductors, where it is assumed that the attraction forces between surface polar faces of the small crystals are the responsible for the chains formation. Since there are not too many mechanisms responsible for the attraction we assume that a dipolar interaction is the force that originates the formation of chain-like grain clusters. The study of this property can be useful for the understanding of nucleation processes in the growth of semiconductor thin films.