Abstract Land use pattern classification of remote sensing imagery data is imperative to research that is used in remote sensing applications. Remote sensing (RS) technologies were exploited to mine some of the significant spatially variable factors, such as land cover and land use (LCLU), from satellite images of remote arid areas in Karnataka, India. Four diverse classification techniques unsupervised, and supervised (Maximum likelihood, Mahalnobis Distance, and Minimum Distance) are applied in Bellary district in Karnataka, India for the classification of the raw satellite images. The developed maps are then visually compared with each other and accuracy evaluations make using of ground-truths are carried out. It was initiated that the Maximum likelihood technique gave the finest results and both Minimum distance and Mahalnobis distance methods overvalued agricultural land areas. In spite of missing a few insignificant features due to the low resolution of the satellite images, a high-quality accord between parameters extracted automatically from the developed maps and field observations was found. applications RS (RS factors LCLU, LCLU , (LCLU) Karnataka unsupervised Distance groundtruths ground truths out highquality high quality found (LCLU

CaF2 films were grown on <img src="http:/img/fbpe/bjp/v30n3/cem.gif" alt="cem.gif (148 bytes)"> silicon using the neutral cluster beam deposition technique. These films were highly crystalline and c-axis oriented. Superconducting YBCO thin films were grown on the CaF2 buffered silicon using the laser ablation technique. These films showed Tc(onset) at 90K and Tc(zero) at 86K. X-ray diffraction analysis showed that the YBCO lms were also oriented along the c-axis.

Calcium Fluoride buffer lavers were grown on Si < 100 > substrates using the low energy cluster beam deposition technique. The films were annealed at various temperatures ranging between 500oC and 700oC. The SEM studies showed that as-deposited films were well oriented along the c-axis and had very smooth surface morphology. The annealed films on the contarary, showed lowering of peak intensities and roughening of the surface. The dielectric constant derived from the C-V measurements at 1 MHz were 2.01 and 18 for as-deposited and annealed films respectively.