The objective of this work is the Hot Filament Chemical Vapor Deposition (HFCVD) of diamond films on stainless steel substrates using a new technique for intermediate barrier forming, made by laser cladding process. In this technique, a powder layer is irradiated by a laser beam to melt the powder layer and the substrate surface layer to create the interlayer. The control of the laser beam parameters allows creating homogeneous coating layers, in rather large area in few seconds. In this work, the silicon carbide powder (SiC) was used to create an intermediate layer. Before the diamond growth, the samples were subjected to the seeding process with diamond powder. The diamond deposition was performed using Hot-Filament CVD reactor and the characterizations were Scanning Electron Microscopy, X-ray diffraction, Raman Scattering Spectroscopy and Scratch Test.

In this work, an active screen plasma discharge system based technology was incorporated in a PECVD reactor for DLC films growth, making it a new development in DLC films deposition. In this case, the active screen system is used to seek better electrons confinement, which might result in high ions density due to the collisions number increase, leading to a possible increase in ionization. DLC films were grown on steel substrates, using two variations of this system. In order to enhance adhesion between coating and substrate, a silicon interlayer was deposited, using different bias voltages. Morphological and structural characterization was performed by scanning electron microscopy, optical profilometry and Raman scattering spectroscopy. Tribological tests were performed by nanohardness, scratch and wear tests. Results showed that the plasma confinement promoted good films adhesion, which may be related to a high sub-implantation. This might be a consequence of the pressure decrease, as well as, to the ions energy distribution narrowing.

AbstractThis paper shows successful hindering of the negative effects of the cobalt binder in the process of coating WC-Co cutting tools with CVD diamond films. The strategy was creating a boron-rich layer on the surface of the WC-Co substrates as an interlayer to block Co migration. The traditional boriding technique was improved by preheating the salt powders and controlling the brittle region thickness in the substrate surface. These procedures produce a tougher surface for diamond growth. Adding CF4 to the gas mixture also enhanced diamond adhesion to the surface. The adhesion of diamond films to WC-Co substrates was evaluated by indentation tests. Samples were characterized by Scanning Electron Microscopy (SEM), Energy Dispersive X-ray (EDX), X-ray Diffraction (XRD) and Raman Scattering Spectroscopy (RSS).

Realizaram-se crescimentos de filmes de diamante por deposição química de vapor (CVD, do inglês Chemical Vapor Deposition) em substratos de silício (100), de grande área (80 cm²), em um reator de filamento quente (HFCVD), com taxas de crescimento superiores a 1,5 µm/h. Foi realizado o crescimento das amostras com diferentes fluxos gasosos e diferentes porcentagens de metano (CH4) em hidrogênio (H2). As amostras foram caracterizadas por microscopia óptica, eletrônica de varredura e por espectroscopia de espalhamento Raman. Tais análises acusaram a presença de diamante de alta pureza em todas as amostras.

Diamond films were grown through Chemical Vapor Deposition (CVD) in silicon substrates (100) of large area (80 cm²), in a hot filament chemical vapor deposition (HFCVD), with growth rates over 1,5 µm/h. The growth of samples was made with different gaseous fluxes and different methane percentages (CH4) in hydrogen (H2). The samples were analyzed through optical microscopy, Scanning Electron Microscopy and Raman spectroscopy scattering. Such analyzes showed the presence of a high purity diamond in all samples.

O preparo dos substratos, para o crescimento de filmes de diamante CVD, é de fundamental importância por diversos fatores. Um novo método de preparação dos substratos de molibdênio, o jateamento por óxido de alumínio, é apresentado e comparado com os métodos tradicionais de preparo. As amostras de diamante CVD obtidas foram analisadas por espectroscopia de espalhamento RAMAN e por microscopia eletrônica de varredura (MEV). Obtiveram-se filmes de diamante CVD de boa qualidade e uniformidade e o novo processo proposto de tratamento do substrato de molibdênio permitiu maior taxa de crescimento que os métodos tradicionais.

The substrate preparation for CVD diamond growth is of basic importance due to several reasons. A new molybdenum substrate preparation method, the aluminum oxide abrasion jetting, is introduced and compared with the traditional ones. Raman Scattering Spectroscopy (RSS) and Scanning Electron Microscopy (SEM) characterize CVD diamond films. CVD diamond films of good quality and uniformity were obtained. The substrate preparation by aluminum oxide blasting allowed for a higher nucleation rate.

Surfaces with very poor mechanical and frictional properties can be improved, or even, acquire new properties similar to diamond if good adherent CVD diamond film is obtained on it. In this work, nitrogen ions were sub-implanted on pure molybdenum as a means to enhance CVD diamond film adherence. Deposition time from 2 up to 60 h were used for deposition of 10 to 400 µm thick CVD diamond films with very good adherence on sub-implanted molybdenum substrate. Characterizations were carried out by XPS, X-ray diffraction and nano indentation on prepared surfaces prior to diamond growth and after the onset nucleation. The ionic sub-implantation with nitrogen possibly assists in adhesion, with the creation of a thin layer of nitrates and complexes.

Boron-doped polycrystalline diamond films have been deposited over silicon substrate by hot-filament chemical-vapor-deposition process. A gas mixture of 0,5 vol. % methane and 1 vol. % methanol on hydrogen at a pressure of 50 Torr, have been used. Boric oxide dissolved in methanol have been used as the boron doping source during the diamond growth process. Raman spectroscopy and Scanning Electron Microscopy (SEM) have been performed on the samples. A change of Raman spectra with film doping was observed. The diamond characteristic line at 1333 cm-1 down shifted and its intensity decreased as the film resistivity decreased. On the other hand, a broad peak around 1220 cm-1 appeared and its intensity increased with decreasing film resistivity. No modifications on films morphology have been observed with different boron doping level. The grains were well-faceted with 2 <FONT FACE="Symbol">m</font>m average size